KEY FEATURES

Universality in sample imaging with field-free ultra-high resolution Optics

• - The BrightBeam™ SEM column delivers field-free ultra-high resolution imaging (0.9 nm at 15 keV, 1.3 nm at 1 keV) while maintaining universality in sample imaging and analysis.
• - Excellent imaging performance at low-beam energies ideal for imaging non-conducting samples and uncoated biological specimens. A low vacuum mode is also available.
  - High electron beam currents up to 400 nA are advantageous for microanalytical techniques such as CL, EDX, WDX and EBSD.
• - Detection system with angle-selective and energy-filtering capabilities give complete control of surface sensitivity and the option to explore with different contrast.

High Performance Ion Optics

• - Novel Orage™ FIB column featuring cutting-edge ion optics achieves ultra-high resolution over the entire beam energy range and excellent performance at low energies for preparing damage-free, ultra-thin TEM specimens.
• - Ion beam currents up to 100 nA cut completion time in half for cross-sectioning and lamella lift-out processes.
• - Dedicated software enables easy and quick three-dimensional sample reconstructions that provide unique ultra-structural sample information.
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