Newly designed electron column for superb Ultra-High Resolution. The MAIA3 model 2016 is an ultra-high resolution SEM with excellent imaging capabilities in the whole range of beam energies.
MAIA3? - Newly designed ultra-high resolution electron column for superb imaging. Download the brochure!
PDF – 6.1 MB
Triglav™ - newly designed UHR electron column
TriLens™ - objective system: unique combination of three-lens objective and crossover-free beam path
Advanced detection system with multiple SE and BSE detectors TriSE™ and TriBE™
Triglav™ - Ultimate ultra-high resolution at low beam energy: 1 nm at 1 keV and 0.7 nm at 15 keV
Electron beam currents up to 400 nA and rapid beam energy changes
Triple BSE detection TriBE™ for angle-selective signal collection. The Mid-Angle BSE and In-Beam LE-BSE detectors are located inside the column and detect medium-angle and axial backscattered electrons, while the In-Chamber BSE Detector detects wide-angle electrons. Together, they deliver a variety of imaging contrasts and enable low-energy detection down to 200 eV.
Triple SE detection TriSE™ to capture SE signal optimally in all working modes. The In-Beam SE detector inside the column enables detection of electrons at very short working distances. SE detector for beam deceleration mode gives ultimate resolution in BDM. The In-Chamber SE detector delivers superb topographic contrast.
서울 금천구 가산동 서부샛길 606 대성디폴리스 A-802 (주)테스칸코리아 대표자 : 김재환 l 사업자등록번호 : 109-81-97174 l 개인정보책임자 : 정옥윤 l TEL : 02-861-8056 l FAX : 02-861-8066 l 이메일 : email@example.com Copyright ⓒ (주)테스칸코리아. ALL Rights Reserved. [[개인정보취급방침]]